Category Archives: Facilities

Visited Central Research Institute of Electric Power Industry. 【見学】電力中央研究所

18 Dec. 2015
After a lunch time (Turkish food) around Kamakura station; we (12 students) visited Central Research Institute of Electric Power Industry (電力中央研究所) in Yokosuka city (Kanagawa prefecture).

Since 2008, some of lab’s members have been collaborating with CRIEPI on measuring particulate matters (PM) at the exhaust of coal-based power plant.

Thanks to Noda san, Shimizu san, and Makino san for our study tour.




Joint Seminar with School of Agriculture Labs 農学府の研究室と合同セミナー

IMG_075014 Dec. 2015:
Two of our students have presented their studies at a joint seminar with Hatakeyama Lab and Matsuda Lab.

Place: FM Tama Kyuryo (Matsuda Lab)

More than four students have also visited FM Tama Kyuryo (an experimental “forest” of TUAT sites) in November 2015, for the rain water samples.


116 high-school students with parents visited our lab, 工学部説明会・オープンキャンパス

We were one of two labs of TUAT Chemical Engineering for Open-Campus (21 August 2015)


Main host: Master students (Ishimoto: presenter and Takagi: Tour leader)
Visitors: High-school students, parents, etc. 高校生(既卒者、高専生、保護者、高校の先生、塾・予備校の関係者、社会人の参加も歓迎)

5 minutes movie: Open-campus in 2014 Summer (Our lab was in this movie)

Our open lab (until now) /open-lab/

A workstation for numerical simulation, 計算機

A simulation hardware: 計算機
RAM: 32 GB; HD = 1 TB;
CPU : Intel ® Xeon® Processor X5690(3.46 GHz, 6 core)


Simulation software:, 数値シミュレーション(有限要素法、熱流体、など)
FEM based multi-physics COMSOL From fluid flow/heat transfer to structural mechanics and electromagnetic analyses.

Other Facilities : 他の設備

UV, visible, near-IR spectrophotometer, 顕微紫外可視近赤外分光

A new tool (Place: 3rd floor BASE building)

MSV-370 type microscope attached to ultraviolet-visible-near infrared spectrophotometer.
A microspectroscopy system providing transmittance or reflectance measurements of microscopic sample sites for a wide range of wavelengths (Continuous measurements between 250 and 2,000 nm). ** Conventional measurements require samples with dimensions comparable to an mm sized optical beam. This device can measure color, film thickness, and other spectral properties of a microscopic area for either large or small samples.

= First/previous administrator: Prof. T. Nakato (from Oct. 2011 with Kyushu Inst. Tech.)

顕微紫外可視近赤外分光光度計 MSV-370

>> Other facilities around us: LIST >> /about/facilities/

Energy-Dispersive XRF Spectrometer.蛍光X線分析装置

An apparatus from 5 Sept. 2011
Energy-Dispersive X-ray Fluorescence Spectrometer
Place: BASE 3rd-Floor, 1st Administrator (1st): Seki (M1)

Picture from
Picture from

新規導入:JSX-3100RII 蛍光X線分析装置
液体窒素フリー, Si(Li) 半導体検出器

>> Other facilities around us. >> LIST